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Learn JMP Events

Events designed to further your knowledge and exploration of JMP.

Monitoring and Controlling Complex Manufacturing Processes

Presented in English

Published on by gail_massari | Updated on

See how to:

Screen multiple processes over time
- Examine one process at a time using Control Chart Builder
- Examine and compare multiple processes using Process Screening

See how to:

Understand process shift
- Subgroup sample size
- Set shift and outlier threshold
- Set shift detection parameter
- Interpret Exponentially Weighted Moving Average (EWMA)

See how to:

Conduct non-normal capability studies
- Interpret Goodness of Fit, normal quantile plots and nonparametric densities
- Set distribution for each process
- Save distributions as column properties for further studies
- Interpret Capability Index Plots

See how to:

Start:

Wed, Aug 12, 2020 02:00 PM EDT

End:

Wed, Aug 12, 2020 03:00 PM EDT

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