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Events designed to further your knowledge and exploration of JMP.
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Monitoring and Controlling Complex Manufacturing Processes

Presented in English
Published on ‎11-07-2024 03:28 PM by Community Manager Community Manager | Updated on ‎08-26-2026 04:40 PM

 

 

See how to:

  • Screen multiple processes over time
    • Examine one process at a time using Control Chart Builder
    • Examine and compare multiple processes using Process Screening

 

 

 

See how to:

  • Understand process shift
    • Subgroup sample size
    • Set shift and outlier threshold
    • Set shift detection parameter
    • Interpret Exponentially Weighted Moving Average (EWMA)

 

 

See how to:

  • Conduct non-normal capability studies
    • Interpret Goodness of Fit, normal quantile plots and nonparametric densities
    • Set distribution for each process
    • Save distributions as column properties for further studies
    • Interpret Capability Index Plots

 

 

 

See how to:

  • Compare multiple capability studies
    • Set stability ratio and PPK capability boundaries
    • Interpret process performance graphs

Resources



Start:
Wed, Aug 12, 2020 02:00 PM EDT
End:
Wed, Aug 12, 2020 03:00 PM EDT
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