cancel
Showing results for 
Show  only  | Search instead for 
Did you mean: 
  • Instantly extract effect sizes, F-ratios, and FDR-adjusted p-values from your models with the Calculate Effects Sizes extension, available now in the JMP Marketplace!
  • New to JMP? Join us Sept. 23-24 for the Early User Edition of Discovery Summit, tailor-made for new users. Register now for free!
  • See how to use the JMP Marketplace – Free tools to expand JMP capabilities. Register. July 10, 2 pm US Eastern Time.

Learn JMP Events

Events designed to further your knowledge and exploration of JMP.
Choose Language Hide Translation Bar

Monitoring and Controlling Complex Manufacturing Processes

Presented in English
Published on ‎11-07-2024 03:28 PM by Community Manager Community Manager | Updated on ‎11-07-2024 05:38 PM

See how to:

  • Screen multiple processes over time
    • Examine one process at a time using Control Chart Builder
    • Examine and compare multiple processes using Process Screening

 

See how to:

  • Understand process shift
    • Subgroup sample size
    • Set shift and outlier threshold
    • Set shift detection parameter
    • Interpret Exponentially Weighted Moving Average (EWMA)

See how to:

  • Conduct non-normal capability studies
    • Interpret Goodness of Fit, normal quantile plots and nonparametric densities
    • Set distribution for each process
    • Save distributions as column properties for further studies
    • Interpret Capability Index Plots

 

See how to:

  • Compare multiple capability studies
    • Set stability ratio and PPK capability boundaries
    • Interpret process performance graphs

Resources



Start:
Wed, Aug 12, 2020 02:00 PM EDT
End:
Wed, Aug 12, 2020 03:00 PM EDT
Attachments
0 Comments