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  • DownloadSemiconductor Toolkit: Tools to create wafer maps, add wafer geometry to graphics, explore die defects & compare wafers.
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  • JMP multivariate capabilities let you understand relationships between multiple variables simultaneously. See how. Friday, Aug. 14, 2 pm US ET.

JMP On Air

Fit Y by X

(view in My Videos)

 

In today’s JMP In Action, Florian Vogt demonstrates how to explore relationships between two variables. First, Florian introduces us to the four personalities of Fit Y by X, defined by modeling types we specify: Continuous X by Continuous Y (Bivariate Analysis); Categorical X and Continuous Y (One Way); Continuous X and Categorical Y (Logistic); and Categorical X by Categorical Y (Contingency). Then, Florian shows you Fit Y by X in action using practical data, specifically push-ups he’s performing during quarantine. Though he gives us a detailed look at relationships between two variables, Florian doesn’t answer the real question we’re all asking: What will Florian’s upper body look like after he completes his push-up challenge?