Authors
Yi Ji (1), Ryan Lekivetz (2), Simon Mak (1) and Joseph Morgan (1)
Affiliations
(1) Duke University, Durham, NC
(2) JMP Statistical Discovery LLC
Journal
2023 IEEE 23rd International Conference on Software Quality, Reliability, and Security Companion (QRS-C)
Date Published
2023
Abstract
Fault localization is a software testing activity that is critical when software failures occur. We propose a novel Bayesian fault localization method, yielding a principled and probabilistic ranking of suspicious input combinations for identifying the root causes of failures.
Citation
Ji, Y., Lekivetz, R., Mak, S. and Morgan, J., 2023, October. BayesFLo: Bayesian fault localization for software testing. In 2023 IEEE 23rd International Conference on Software Quality, Reliability, and Security Companion (QRS-C) (pp. 865-866). IEEE, https://doi.org/10.1109/QRS-C60940.2023.00019.