This is the code that currently works , but i would like to automate it and probably hard code the section in BOLD Italics below - which is the list of CMOS_Lot-Wafer from the "Wafer List" datatable, I have also attachged the code that i tried to hard code this section and does not work. Could someone take a look at it and help me out please, Thanks
(Wafer list is the user list that the user will provide)
dt1 = Data Table( "Wafer List" ) << Stack(
columns( :Name( "Group A - Wafer Number" ), :Name( "Group B - Wafer Number" ) ),
Source Label Column( "Label" ),
Stacked Data Column( "CMOS-Lot-Wafer" ),
Output Table( "Stacked-waferList" )
);
dt3 = Open Database(
"DSN=MS_SQL;Description=WAFERVIEWER;Trusted_Connection=Yes;APP=JMP;WSID=USSJC-J9K98H2;DATABASE=PRODUCT;",
"SELECT T.[CHECK AXSELFTEST], T.[CMOS_Lot-WaferID] FROM Summary S
INNER JOIN WS_Tests T ON T.[CMOS_Lot-WaferID] = S.[CMOS_Lot-WaferID] AND T.RetestID = S.RetestID
WHERE S.[CMOS_Lot-Wafer] IN ('DBM301-02',
'DBM308-12',
'DBM306-24',
'DBM297-03',
'DBM308-20',
'DBM297-02',
'DBM316-03',
'DBM306-09',
'DBM024-09'
)",
"Summary"
);
dt2 = Data Table( "Stacked waferList" ) << Join(
With( Data Table( "Summary" ) ),
Select( :Label, :Name( "CMOS-Lot-Wafer" ), :Name( "CMOS_Lot-WaferID" ) ),
SelectWith( :DieID, :CHECK AXSELFTEST ),
By Matching Columns( :Name( "CMOS_Lot-WaferID" ) = :Name( "CMOS_Lot-WaferID" ) ),
Drop multiples( 0, 0 ),
Include Nonmatches( 1, 0 ),
Preserve main table order( 1 ),
Output Table( "WS- Summary for WaferList" )
);
//Code does NOT work - I tried to hard code the CMOS_Lot-Wafer part but does not work
(Wafer list is the user list that the user will provide)
dt1 = Data Table( "Wafer List" ) << Stack(
columns( :Name( "Group A - Wafer Number" ), :Name( "Group B - Wafer Number" ) ),
Source Label Column( "Label" ),
Stacked Data Column( "CMOS-Lot-Wafer" ),
Output Table( "Stacked-waferList" )
);
SQLConnection = Create Database Connection(
"DSN=MS_SQL;Description=WAFERVIEWER;Trusted_Connection=Yes;APP=JMP;WSID=USSJC-J9K98H2;DATABASE=ISTANBUL;"
);
PrePUSQL01 =
"SELECT
T.CHECK AXSELFTEST,
C.CMOS_Lot-Wafer
FROM database.dbo.WS_tests AS T
JOIN Stacked waferList AS C ON C.CMOS_Lot-Wafer = T.CMOS_Lot-Wafer";
dt = Execute SQL( SQLConnection, PrePUSQL01, "dt" );