User Community
cancel
Turn on suggestions
Auto-suggest helps you quickly narrow down your search results by suggesting possible matches as you type.
Showing results for 
Show  only  | Search instead for 
Did you mean: 
  • DownloadSemiconductor Toolkit: Tools to create wafer maps, add wafer geometry to graphics, explore die defects & compare wafers.
  • Discovery Summit 2026: Early User Edition - September 23-24.Register. It's free.
  • See how to design an experiment, explore factor-response relationships, assess tradeoffs, and ID best settings. Register for Sep. 11 Mastering JMP.

Discussions

Solve problems, and share tips and tricks with other JMP users.
Choose Language Hide Translation Bar
Leonard
Leonard
Level III

Cauchy distribution. Where is Process capability button?

Created: Aug 12, 2020 07:45 AM  |  Last Modified: Jun 10, 2023 4:17 PM (8820 views)

Leonard_1-1597232406513.pngLeonard_1-1597232406513.png

Leonard_2-1597232469312.pngLeonard_2-1597232469312.png

Leonard_3-1597232583656.pngLeonard_3-1597232583656.png

Why where is no Process Capability button? Or you can't do it with Cauchy's distribution data.

 

Leonard_0-1597232313682.pngLeonard_0-1597232313682.png

 

0 Kudos
10 REPLIES 10
shampton82
shampton82
Level VII

Re: Cauchy distribution. Where is Process capability button?

Aug 12, 2020 11:32 PM (1367 views)  |  Posted in reply to message from Kevin_Anderson 08-12-2020

Is this count data?  If so a couple of ideas: You could turn it into pass/fail based upon your defect limit then convert your defect rate to a Ppk from a sigma-DPMO-Ppk table.  You could also fit it as Poisson and use the distribution profiler to determine what your DPMO rate was (by setting the x axis to your spec limit and using the returned Y value) and convert that into a Ppk. The other option would be to turn your zero's into 0.0001's and then you'll have some additional distributions you can fit.

0 Kudos

Recommended Articles