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MSA and SPC: Some Pitfalls and How to Avoid Them ( 2019-EU-30MP-063 )

Level: Intermediate
Job Function: Analyst / Scientist / Engineer
François Bergeret, Founder and Statistician, Ippon Innovation

First we will demonstrate JMP methods of measurement system analysis (uncertainty calculations and R&R) to show the limits of certain indicators and to propose solutions. In a second part, we will deal with control charts, showing some pitfalls to avoid when the usual assumptions of the statistical process control are not respected: normality, independence, single source of variation, and how to treat them pragmatically but statistically with JMP. Capability aspects of the process will also be discussed. We will also discuss the rare events control charts. We will illustrate all the topics on industrial data from several industries (pharma, microelectronics).

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