Scientists and engineers are dealing with more and more data streamed from device-based sensors or batch process monitors. Hundreds or thousands of such data streams can create a large volume of data, very quickly, posing a unique set of challenges. No matter what your industry, common difficulties exist with this type of data: simplifying and cleaning up messy data, removing outliers and building models that characterize an underlying function or relate a continuous data stream to measures of performance, such as yield, defect rate or product quality. With Functional Data Explorer in JMP Pro 14, you can take advantage of this functional data, easily performing data cleanup, transformation, visualization and feature extraction. Ultimately, this allows you to more easily build models you can use to design experiments, characterize processes or make predictions.