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Integrated Process Improvement Using the Second-Generation Quality Tools in JMP® ( US 2018 213 )

Level: Intermediate
Laura Lancaster, JMP Principal Research Statistician Developer, SAS
Annie Dudley Zangi, JMP Senior Research Statistician Developer, SAS

The second-generation quality tools in JMP – Control Chart Builder, Process Capability, Measurement Systems Analysis and Process Screening – were designed with an integrative philosophy to make quality analysis easier and more effective. For example, the new Process Capability platform was designed to reflect the type of control chart used in the statistical process control program, and a capability report was added inside of the Control Chart Builder. Similarly, the Shift Detection Profiler in the Measurement Systems Analysis platform allows quality engineers to make informed decisions about how to design their control chart methodology, taking into account their measurement system so they are alerted to process changes as quickly as possible. Understanding how your measurement system, statistical process control program and process capability assessments fit together is key to improving and maintaining quality. The software’s unique design philosophy makes this simple and straightforward. Additionally, the ability to quickly screen large numbers of processes for stability with the new Process Screening platform will save time, reduce workload and improve quality. This session will use a case study to show how to use each of these platforms with an integrated process improvement approach.