Assessing and Improving the Product Reliability of Integrated Circuits with Statistics
Yves Chandon, Six Sigma Black Belt, Freescale Analog Product Group
Statistics enable key improvements in reliability throughout the standard product life cycle. During the design and production phases, stress tests help identify weaknesses and create an estimate of longevity. Quality control testing helps reduce product failure during customer use. Finally, Life Distribution can predict defect rates and model the reliability of products, helping to improve customer service responses. JMP scripting can help quality engineers successfully prevent defects and improve products. In this session, reliability analysis of integrated circuits produced for the automotive industry will be used as a case study to demonstrate the power and utility of JMP.