Excursions can lead to significant costs at a manufacturing facility. In the semiconductor industry, production downtime, scrapped and low-yield wafers, and decreased output can result in substantial revenue losses. Engineers tasked with investigating these excursions must quickly uncover actionable insights for data-driven decisions that minimize downtime and improve product quality.

JMP's Analytic Workflow can help you outline the steps and tools needed to efficiently investigate excursions. Explore how Query Builder facilitates data access from databases and how JMP's powerful Tables menu aids in data manipulation. Discover optimal table formats for visualizing and analyzing wafer map data. Utilize exploratory and analytical techniques to discover hidden relationships across manufacturing process steps.  Enhance your analysis with JMP Pro, leveraging features like image analysis in the new Torch Deep Learning Add-In for JMP Pro 18 to gain advanced insights.

Automate and rerun your entire analysis using Workflow Builder in JMP, ensuring speed, repeatability, flexibility, and analytical power without the need for coding. Learn how leveraging these tools and techniques in JMP and JMP Pro can lead to efficient resolution and substantial cost savings in a fast-paced manufacturing environment.