Sue Walsh, Technical Support Statistician, SAS
Analysts in many application areas often have a response variable that has only two possible levels, with one of those being the desired outcome. Binary logistic regression will allow the analyst to predict the probability of the desired outcome, determine which input variables are most closely associated with those outcomes, and produce odds ratios that provide a measure of the effect on the outcome. This presentation will provide an introduction to the analysis of this type using binary logistic regression in the Fit Y by X and Fit Model platforms of JMP. It will discuss the interpretation of the results including p-values, odds ratios, graphical displays and goodness of fit statistics.
