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CorinneBerges
Level II

Usages of the degradation analysis platform in automotive semiconductor test

Corinne Bergès
Six Sigma Black Belt for Analog & Sensor Business Quality Group, PhD
NXP Semiconductor SAS

 

Abstract:

Jmp PRO degradation analysis platform can be used for different purposes. We would like to present two case studies in the automotive semiconductor test.

In a first example, power mos are tested at customer’s site and electrical measures monitor component behavior in ten points in a very short time period. To help our customer to understand the breakdownoot cause of a part of the mos components, ten-points curve of these measures are compared between the not-failed parts and the failed ones: the jmp tool used for that was the degradation analysis platform.

Another case study for that same platform was a drift analysis on High Temperature Operating Life Test (HTOL) values. The test was initially performed during 2000 hours but a later request was about a 4000 hour test duration. Platform degradation analysis allowed to avoid an additional costly test: it found several families of curve shape among the 1200 tests and succeeded to predict the ones for them the drift at 4000 hours was likely to be superior at 10%, maximal admissible value.