Short Runs, Big Data, No Problem: A Control Chart Remix (2025-US-30MP-2585)

As manufacturing processes grow more complex, so does the challenge of effectively monitoring the countless input and output parameters that drive quality and yield. Traditional control charts often fall short when faced with high-dimensional data or small batch sizes run across shared equipment.

This session explores an innovative solution: a short run model driven multivariate control chart that combines the strengths of both approaches into a flexible, scalable monitoring tool. While not yet a built-in feature in JMP, this method can be easily created with minimal scripting and takes full advantage of JMP’s interactive visualization and dynamic linking capabilities.

Join us to see how this approach empowers engineers and analysts to quickly detect issues, streamline decision making, and improve process control in fast-paced, high-mix manufacturing environments.