This website uses Cookies. Click Accept to agree to our website's cookie use as described in our Privacy Policy. Click Preferences to customize your cookie settings.
Understanding Complex Yield Issues with Sensor Data - 5 Minute Case Study
Created:
Nov 27, 2018 04:19 PM
See how you can increase yields by finding complex and subtle causes of defects from in-process sensor data. In this case study very small differences in the process variable ramp rates were found to be responsible for an expensive yield problem.
You must be a registered user to add a comment. If you've already registered, sign in. Otherwise, register and sign in.