Monitoring and Controlling Complex Manufacturing Processes

See how to:

• Screen multiple processes over time
  • Examine one process at a time using Control Chart Builder
  • Examine and compare multiple processes using Process Screening

See how to:

• Understand process shift
  • Subgroup sample size
  • Set shift and outlier threshold
  • Set shift detection parameter
  • Interpret Exponentially Weighted Moving Average (EWMA)

See how to:

• Conduct non-normal capability studies
  • Interpret Goodness of Fit, normal quantile plots and nonparametric densities
  • Set distribution for each process
  • Save distributions as column properties for further studies
  • Interpret Capability Index Plots

See how to:

• Compare multiple capability studies
• Set stability ratio and PPK capability boundaries
• Interpret process performance graphs

Resources

• JMP Learning Library, Quality & Process (Capability)
• JMP Documentation on Capability Studies
• NIST Handbook – Section on Process Capability