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Feb 27, 2013

MSA and SPC Slides

These slides provide Peter Bartell's overview of measurement system analysis principles, including comparing Gauge R&R to the EMP (Evaluating the Measurement Process) approach described by Don Wheeler in the book EMP III –Using Imperfect Data (2006). Also included is data to use to practice using some of the techniques Peter presented. The slides were presented live and in recorded videos on Gauge R&R, EMP, and process monitoring as part of the Mastering JMP webcast series in 2015. Watch the videos at

Here are several books mentioned in the webcast:

  • EMP III (Evaluating the Measurement Process): Using Imperfect Data by Donald J. Wheeler, 2006
  • Economic Control of Quality of Manufactured Product by Walter A Shewhart, 2002
  • Advanced Topics in Statistical Process Control: The Power of Shewhart's Charts  by Donald J. Wheeler, 2004
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