London, Paris, Cologne: Explore reliability in Europe
Feb 28, 2012 9:30 AM
Are you based in Europe? Join our JMP Explorers seminar series in March in London, Paris and Cologne.
This complimentary thought leadership seminar series features reliability experts who will highlight trends in statistical assessment and share techniques to reach maximum productivity in your analyses:
Bill Meeker, PhD, is a Distinguished Professor of Liberal Arts and Sciences at Iowa State University and a Fellow of the American Statistical Association.
Leo Wright is Product Manager of Six Sigma and Quality Solutions for JMP, a division of SAS.
Vincent Couallier, PhD, has a doctorate in applied mathematics, teaches at the University of Bordeaux and works as a research fellow at the Institute of Mathematics of Bordeaux. He specializes in statistics for reliability.
Léo Gerville-Réache, PhD, has a doctorate in applied mathematics, teaches statistics at the University of Bordeaux and is a research fellow at the Mathematics Institute of Bordeaux since 1999. Since 2005, he has also been a consultant on statistical reliability for corporations.
Learn more about these reliability events and sign up: