I have process signal traces and identify pulse traces against random wafer forms. In the plot below , only signal values with adjacent sampling points have non-zero value, but if 1 sample point has non-zero values it is to be discarded.
Secondly, only pulse traces with a threshold above a certain value , say 1.5 like here, are to be counted.
I am looking to develop a simple script for this. The signalv, samples and traces are stored as columns .