HI,
I have just recently installed JMP 12.
One of the main reasons I did so was to improve our data mining capabilities by possibly using the "Clustering Improvements" introduced in JMP 12.
My basic need is to divide wafer patterns into groups in order to perform a commonality analysis with the intention of finding the sources of variation.
As stated in the JMP 12 release notes:
"In the semiconductor and other industries, it is important to determine clusters of wafer defect patterns. This previously meant creating one variable to make XY coordinates, then splitting on this dimension, clustering, and merging the clusters. Now, JMP accomplishes this in one step."
There is an illustration showing an example of what I would like to do:
I have a need to perform such analyses quite often. An example from this week is seen below:
I need to determine how many similar patterns exist and how many wafers belong to each pattern?
Has anyone performed such an analysis?
Is there a good tutorial / guide available anywhere?
I am sure that this is of major interest to semiconductor and MEMs device manufacturers.
This case could be a good candidate for some forthcoming JMP Discovery Summit
All advice and input is appreciated.
- Philip