cancel
Showing results for 
Show  only  | Search instead for 
Did you mean: 
  • Instantly extract effect sizes, F-ratios, and FDR-adjusted p-values from your models with the Calculate Effects Sizes extension, available now in the JMP Marketplace!
  • New to JMP? Join us Sept. 23-24 for the Early User Edition of Discovery Summit, tailor-made for new users. Register now for free!
  • Your voice matters! Tell us how you prefer to receive JMP updates, so we can tailor our communication to your needs. Take short survey.

Discussions

Solve problems, and share tips and tricks with other JMP users.
Choose Language Hide Translation Bar

Extreme-Value Parameter Estimates

Not sure how Extreme-Value Parameter Estimates compare to  alpha/beta estimates used in the Weibull Parameter Estimates for days to failure plots.

 

charles_revelle_1-1668625318021.png

Understand beta of >1 means in Weibull indicates the device will continue to failure over-time, is the Extreme-Value Estimates just a transform of the Weibull Analysis?

 

Thanks, 

Charles

JMP 17

 

1 ACCEPTED SOLUTION

Accepted Solutions

Re: Extreme-Value Parameter Estimates

Mark,

 

Thanks for the info..  Went back and re-read Bill Meeker book. Think I will stick with Weibull and LogNormal for a device that "gracefully" degrades over time.  Appears Extreme Value is better for early life failures with increasing hf.

 

Thanks,

 

Charles

View solution in original post

2 REPLIES 2

Re: Extreme-Value Parameter Estimates

The Weibull distribution cumulative distribution function is related to the Smallest Extreme Value distribution CDF:

 

weibull 1.PNG

(JMP Training course)

 

The SEV distribution:

 

small.PNG

(JMP Training course)

 

The Weibull CDF above can be transformed from a location-scale parameterization to a scale-shape parameterization:

 

weibull 2.PNG

(JMP Training course)

 

The interpretation of the shape parameter is specifically:

 

hazard.PNG

(JMP Training course)

 

I am not sure if this information is helpful. Continue to ask questions if it is still not clear.

Re: Extreme-Value Parameter Estimates

Mark,

 

Thanks for the info..  Went back and re-read Bill Meeker book. Think I will stick with Weibull and LogNormal for a device that "gracefully" degrades over time.  Appears Extreme Value is better for early life failures with increasing hf.

 

Thanks,

 

Charles

Recommended Articles