Discovery Summit Europe Poster: Detecting Sudden Process Time Variations in a Semicon Fab using Non-standard Control Charts

maria_astals — Fri, 08 May 2026 12:35:28 GMT

Dear Community, I would like to share this very interesting poster presented at Discovery Summit Europe.

Detecting Sudden Process Time Variations in a Semicon Fab using Non-standard Control Charts

This poster is about tracking how long wafers – the thin slices of material used to build chips – spend inside a piece of equipment during a specific manufacturing step. Essentially, we're monitoring the equipment's process time.

Here the link: https://community.jmp.com/t5/Abstracts/Detecting-Sudden-Process-Time-Variations-in-a-Semicon-Fab-using/ec-p/916583#M2319

Other interesting presentations can be found here: https://community.jmp.com/t5/Abstracts/eb-p/abstracts?tags=Europe,2026

topic Discovery Summit Europe Poster: Detecting Sudden Process Time Variations in a Semicon Fab using Non-standard Control Charts in Semiconductor JMP Users Group Discussions

Discovery Summit Europe Poster: Detecting Sudden Process Time Variations in a Semicon Fab using Non-standard Control Charts