topic Why NXP can reduce testing costs while delivering on high quality &amp; reliability standards: Customer Success Story in Semiconductor JMP Users Group Discussions https://community.jmp.com/t5/Semiconductor-JMP-Users-Group/Why-NXP-can-reduce-testing-costs-while-delivering-on-high/m-p/937096#M37 <P class="lia-align-center"><IFRAME src="https://www.youtube.com/embed/EUzCTZMSzl8?si=O0Bsvs7gn4ZJNFCV" width="560" height="315" frameborder="0" allowfullscreen="allowfullscreen" title="YouTube video player" allow="accelerometer; autoplay; clipboard-write; encrypted-media; gyroscope; picture-in-picture; web-share" referrerpolicy="strict-origin-when-cross-origin"></IFRAME></P> <P><SPAN>NXP's Citizen Data Scientist Program is an initiative that delivers both statistical training and tangible results – like eliminating more than 100 tests without losing reliability coverage – to the business. </SPAN></P> <P><SPAN>In this video, Mehul Shroff, Technical Director for Intrinsic/Radiation Reliability at NXP, explains how statistical approaches in place at NXP mean cost reduction doesn't come at a cost to quality.</SPAN></P> <P>&nbsp;</P> Tue, 24 Mar 2026 10:53:04 GMT NatalieStarkey 2026-03-24T10:53:04Z Why NXP can reduce testing costs while delivering on high quality & reliability standards: Customer Success Story https://community.jmp.com/t5/Semiconductor-JMP-Users-Group/Why-NXP-can-reduce-testing-costs-while-delivering-on-high/m-p/937096#M37 <P class="lia-align-center"><IFRAME src="https://www.youtube.com/embed/EUzCTZMSzl8?si=O0Bsvs7gn4ZJNFCV" width="560" height="315" frameborder="0" allowfullscreen="allowfullscreen" title="YouTube video player" allow="accelerometer; autoplay; clipboard-write; encrypted-media; gyroscope; picture-in-picture; web-share" referrerpolicy="strict-origin-when-cross-origin"></IFRAME></P> <P><SPAN>NXP's Citizen Data Scientist Program is an initiative that delivers both statistical training and tangible results – like eliminating more than 100 tests without losing reliability coverage – to the business. </SPAN></P> <P><SPAN>In this video, Mehul Shroff, Technical Director for Intrinsic/Radiation Reliability at NXP, explains how statistical approaches in place at NXP mean cost reduction doesn't come at a cost to quality.</SPAN></P> <P>&nbsp;</P> Tue, 24 Mar 2026 10:53:04 GMT https://community.jmp.com/t5/Semiconductor-JMP-Users-Group/Why-NXP-can-reduce-testing-costs-while-delivering-on-high/m-p/937096#M37 NatalieStarkey 2026-03-24T10:53:04Z