Reduce manufacturing-related operating costs by shortening the testing period

flo_kussener — Wed, 25 Mar 2026 08:44:35 GMT

For decades, testing was limited to 2% of total manufacturing costs with highly advanced automated test equipment capable of performing several different tests at the same time on multiple chips or wafers, and ultimately for different functions as part of system-level testing.

Today, these testing percentages are on the rise again.

Based on run-on-error data and test time data, it is easy to obtain the optimal test order in term of test duration. By plotting a curve of test coverage over time, it is possible to study how to further reduce test duration while quantifying the impact on quality.

https://marketplace.jmp.com/appdetails/Test+Time+Optimizer

With this add‑in, engineers can:
- Reduce overall test time by identifying low‑value or redundant steps
- Lower manufacturing costs through smarter test strategy decisions
- Visualize the Test Coverage vs. Time curve to clearly see tradeoffs and optimization opportunities
- Make data‑driven decisions with an intuitive JMP interface

If improving throughput and efficiency is a priority for your team, this tool can make a measurable impact.

topic Reduce manufacturing-related operating costs by shortening the testing period in Semiconductor JMP Users Group Discussions

Reduce manufacturing-related operating costs by shortening the testing period